mobilEM - Aging of the winding isolation due to high voltage slopes
DFG Post Graduate Program “Integrated Energy Supply Modules für Roadbound E-Mobility“
The new semiconductor generation (SiC, GaN) has a much faster switching behavior compared to Si-based semiconductors. This allows significantly higher switching frequencies with lower losses. The high switching frequencies enable a more compact design, which is of particular relevance in the automotive sector. Fast switching behavior involves steep voltage slopes. These steep voltage slopes lead to a higher electrical stress on the winding insulation system of electrical components. This considerably reduces the life time of these components.
The aim of the project is to identify, analyze and model the causes of accelerated ageing in electrical components. The results are then used to derive methods for reducing accelerated ageing processes in order to fully exploit the advantages of the new semiconductor generation in the future.
This project analyses the ageing effects of the insulation system of electrical components using new types of power semiconductor devices. Damage cases are examined under various conditions in order to define the aging processes more precisely. For the monitoring of effects that lead to damage it is necessary to develop adequate measuring methods, since so far no standards cover the fast switching behavior of the new semiconductor generation. These measurement methods need to meet the requirements of a high bandwidth and a large differential mode.
Another aspect is the analysis of the effects of diverse winding configurations. Depending on the arrangement of the conductors of a winding, different voltage peaks occur between the conductors. This influence is investigated using a developed simulation model. The aim is to identify conductor configuration that enables a reduced ageing process of electrical equipment.
01.10.2013 – 31.03.2018