Sensitivity Analysis Method of Temperature-Dependent Parameters During Turn-on Process of SiC Power MOSFETs
Do, Nguyen-Nghia; Kalker, Sven; Austrup, Isabel; Chiu, Huang-Jen; de Doncker, Rik W.
(2022)
Contribution to a book, Contribution to a conference proceedings
In: [2022 IEEE 7th Southern Power Electronics Conference, SPEC, 2022-12-05 - 2022-12-08, Nadi, Fiji]
Identifier
- DOI: 10.1109/SPEC55080.2022.10058347
- RWTH PUBLICATIONS: RWTH-2023-02598