Sensitivity Analysis Method of Temperature-Dependent Parameters During Turn-on Process of SiC Power MOSFETs
Do, Nguyen-Nghia (Corresponding author); Kalker, Sven (Corresponding author); Austrup, Isabel (Corresponding author); Chiu, Huang-Jen (Corresponding author); de Doncker, Rik W.
Piscataway, NJ] : IEEE (2022, 2023)
Contribution to a book, Contribution to a conference proceedings
In: 2022 IEEE 7th Southern Power Electronics Conference (SPEC) : 5-8 Dec. 2022 / publisher: IEEE
Page(s)/Article-Nr.: 6 Seiten
Institutions
- Institute of Power Electronics and Electrical Drives [614500]
- Chair of Power Electronics and Electrical Drives [614510]
Identifier
- DOI: 10.1109/SPEC55080.2022.10058347
- RWTH PUBLICATIONS: RWTH-2023-02598