Utilizing the Electroluminescence of SiC MOSFETs as Degradation Sensitive Optical Parameter

Ruppert, Lukas Andreas; Laumen, Michael; de Doncker, Rik W.

Piscataway, NJ : IEEE (2022)
Contribution to a book, Contribution to a conference proceedings

In: 2022 24th European Conference on Power Electronics and Applications (EPE'22 ECCE Europe) : 5-9 Sept. 2022 / publisher: IEEE
Page(s)/Article-Nr.: P.1-P.9