Evaluating On-State Voltage and Junction Temperature Monitoring Concepts for Wide-Bandgap Semiconductor Devices

Fritz, Niklas; Kamp, Tobias; Polom, Timothy A.; Friedel, Maximilian; de Doncker, Rik W.

New York, NY : IEEE (2022)
Journal Article

In: IEEE transactions on industry applications
Volume: 58
Issue: 6
Page(s)/Article-Nr.: 7550-7561