Exploiting Distinct Thermal Response Properties for Power Semiconductor Module Health Monitoring

Polom, Timothy A. (Corresponding author); van der Broeck, Christoph Henrik; de Doncker, Rik W. (Corresponding author); Lorenz, Robert D.

New York : IEEE (2020, 2021)
Journal Article

In: IEEE journal of emerging and selected topics in power electronics
Volume: 9
Issue: 4
Page(s)/Article-Nr.: 4865-4878