Toward an In-Depth Understanding of the Commutation Processes in a SiC mosfet Switching Cell Including Parasitic Elements

Fritz, Niklas (Corresponding author); Engelmann, Georges; Stippich, Alexander; Lüdecke, Christoph; Philipps, Daniel A.; de Doncker, Rik W.

New York, NY : IEEE (2020)
Journal Article

In: IEEE transactions on industry applications : IA
Volume: 56
Issue: 4
Page(s)/Article-Nr.: 4089-4101

Identifier