Toward an In-Depth Understanding of the Commutation Processes in a SiC mosfet Switching Cell Including Parasitic Elements

Fritz, Niklas (Corresponding author); Engelmann, Georges; Stippich, Alexander; Lüdecke, Christoph; Philipps, Daniel A.; de Doncker, Rik W.

New York, NY : IEEE (2020)
Fachzeitschriftenartikel

In: IEEE transactions on industry applications : IA
Band: 56
Heft: 4
Seite(n)/Artikel-Nr.: 4089-4101