Real-Time, In Situ Degradation Monitoring in Power Semiconductor Converters

IEEE (2019) [Contribution to a book, Contribution to a conference proceedings]

2019 IEEE Applied Power Electronics Conference and Exposition (APEC)
Page(s): 2720-2727

Authors

Selected Authors

Polom, Timothy A.
van der Broeck, Christoph
De Doncker, Rik W.
Lorenz, Robert D.

Identifier