Semiconductor Temperature and Condition Monitoring using Gate Driver Integrated Inverter Output Voltage Measurement

Schubert, Michael (Corresponding author); de Doncker, Rik W.

IEEE (2018)
Contribution to a book, Contribution to a conference proceedings

In: 2018 International Symposium on Power Electronics, Electrical Drives, Automation and Motion (SPEEDAM)
Page(s)/Article-Nr.: 148-153