Experimental Investigation on the Transient Switching Behavior of SiC MOSFETs Using a Stage-Wise Gate Driver
Engelmann, Georges (Corresponding author); Senoner, Tizian; de Doncker, Rik W.
New York, NY : IEEE (2018)
Journal Article
In: CPSS transactions on power electronics and applications
Volume: 3
Issue: 1
Page(s)/Article-Nr.: 77-87
Identifier
- DOI: 10.24295/CPSSTPEA.2018.00008
- RWTH PUBLICATIONS: RWTH-2018-223920