Experimental comparison of voltage and current source gate drivers for IGBTs
Lüdecke, Christoph; Engelmann, Georges; Oberdieck, Karl; Bündgen, David; de Doncker, Rik W.
Piscataway, NJ : IEEE (2017, 2018, 2023)
Contribution to a book, Contribution to a conference proceedings
In: 2017 IEEE 12th International Conference on Power Electronics and Drive Systems (IEEE PEDS 2017) : Hawaii Convention Center, Honolulu, Hawaii, USA, 12-15 December 2017 / PEDS, IEEE, PELS - IEEE Power Electronics Society, IAS - IEEE Industry Applications Society, University of Hawaii, Hawaii Tourism Authority
Page(s)/Article-Nr.: 460-466
Identifier
- DOI: 10.1109/PEDS.2017.8289280
- DOI: 10.18154/RWTH-2018-223342
- RWTH PUBLICATIONS: RWTH-2018-223342