Temperature Controlled Power Semiconductor Characterization using Thermoelectric Coolers

Engelmann, Georges (Corresponding author); Laumen, Michael; Gottschlich, Jan; Oberdieck, Karl; de Doncker, Rik W.

New York, NY : IEEE (2018)
Journal Article

In: IEEE transactions on industry applications : IA
Volume: 54
Issue: 3
Page(s)/Article-Nr.: i-viii