IGBT junction temperature estimation via gate voltage plateau sensing
van der Broeck, Christoph Henrik; Gospodinov, Alexander; de Doncker, Rik W.
Piscataway, NJ : IEEE (2017)
Contribution to a book, Contribution to a conference proceedings
In: ECCE 2017 : IEEE Energy Conversion Congress & Expo : Cincinnati, Ohio, October 1-5 / sponsored by the IEEE Power Electronics and Industry Applications Societies
Page(s)/Article-Nr.: 5899-5906
Identifier
- DOI: 10.1109/ECCE.2017.8096975
- RWTH PUBLICATIONS: RWTH-CONV-220300