A flexible test bench for power semiconductor switching loss measurements

Piscataway, NJ / IEEE (2015) [Contribution to a book, Contribution to a conference proceedings]

2015 IEEE 11th International Conference on Power Electronics and Drive Systems (PEDS 2015) : Sydney, Australia, 9 - 12 June 2015
Page(s): 442-448

Authors

Selected Authors

Gottschlich, Jan
Kaymak, Murat
Christoph, Martin
de Doncker, Rik W.

Identifier