A thermal modeling methodology for power semiconductor modules

van der Broeck, Christoph Henrik (Corresponding author); Conrad, Marcus; de Doncker, Rik W.

Amsterdam [u.a.] : Elsevier (2015)
Contribution to a conference proceedings, Journal Article

In: Microelectronics reliability
Volume: 55
Issue: 9/10
Page(s)/Article-Nr.: 1938-1944