Model Parameterization of Nonlinear Devices Using Impedance Spectroscopy

Kowal, Julia; Hente, Dirk; Sauer, Dirk Uwe

New York, NY : IEEE (2009)
Journal Article

In: IEEE transactions on instrumentation and measurement : IM
Volume: 58
Issue: 7
Page(s)/Article-Nr.: 2343-2350

Identifier