Model Parameterization of Nonlinear Devices Using Impedance Spectroscopy

New York, NY / IEEE (2009) [Journal Article]

IEEE transactions on instrumentation and measurement : IM
Volume: 58
Issue: 7
Page(s): 2343-2350

Authors

Selected Authors

Kowal, Julia
Hente, Dirk
Sauer, Dirk Uwe

Identifier