Characterization and comparison of high blocking voltage IGBTs and IEGTs under hard- and soft-switching conditions

New York, NY / IEEE (2008) [Journal Article]

IEEE transactions on power electronics : PE
Volume: 23
Issue: 1
Page(s): 172-179

Authors

Authors

Fujii, Kansuke
Köllensperger, Peter
de Doncker, Rik W.

Identifier