Real-Time, In Situ Degradation Monitoring in Power Semiconductor Converters

IEEE (2019) [Contribution to a conference proceedings]

[2019 IEEE Applied Power Electronics Conference and Exposition, APEC, 2019-03-17 - 2019-03-21, Anaheim, CA, USA]

Authors

Selected Authors

Polom, Timothy A.
van der Broeck, Christoph Henrik
de Doncker, Rik W.
Lorenz, Robert D.

Identifier

  • REPORT NUMBER: RWTH-2019-03692