Semiconductor Temperature and Condition Monitoring using Gate Driver Integrated Inverter Output Voltage Measurement

IEEE (2018) [Contribution to a book, Contribution to a conference proceedings]

2018 International Symposium on Power Electronics, Electrical Drives, Automation and Motion (SPEEDAM)
Page(s): 148-153

Authors

Selected Authors

Schubert, Michael
de Doncker, Rik W.

Identifier