IGBT junction temperature estimation via gate voltage plateau sensing

Piscataway, NJ / IEEE (2017) [Contribution to a book, Contribution to a conference proceedings]

ECCE 2017 : IEEE Energy Conversion Congress & Expo : Cincinnati, Ohio, October 1-5 / sponsored by the IEEE Power Electronics and Industry Applications Societies

Authors

Selected Authors

van der Broeck, Christoph Henrik
Gospodinov, Alexander
de Doncker, Rik W.

Identifier