Switched Reluctance Machine Model Considering Asymmetries and Enabling Dynamic Fault Simulation

Piscataway, NJ / IEEE service center (2013) [Contribution to a conference proceedings]

2013 International Electric Machines & Drives Conference (IEMDC 2013) : Chicago, Illinois, USA, 12 - 15 May 2013 / [technical co-sponsors: IEEE Industry Applications Society (IAS); IEEE Industrial Electronics Society (IES); IEEE Power and Energy Society (PES); IEEE Power Electronics Society (PELS)]
Page(s): 979-985

Authors

Selected Authors

Weiss, Claude Pascal
Hübner, Mareike
Hennen, Martin
de Doncker, Rik W.

Identifier